Home › Parametric Test System accelerates throughput via software.
 

Keywords :   


Parametric Test System accelerates throughput via software.

2015-09-30 14:31:07| Industrial Newsroom - All News for Today

Available in 200 V and 1 kV versions, Keithley S530 features Keithley Test Environment (KTE) v5.6 system software that reduces measurement speed to increase wafer-level test throughput for semiconductor production and R&D departments. Software features reduce settling time associated with low current measurements, while system measurement settings and streamlined software execution further improve system speed. Also included, Keithley DMM accelerates low voltage and low resistance measurements.

Tags: system software test throughput

Category:Industrial Goods and Services

Latest from this category

All news
17.05Next MANAchat Series Scheduled for the Week of June 10
15.05Relationship Reviews Strengthening the Partnership Between Manufacturer and Rep
14.05Consolidated Financial Statements for the twelve-month period ended March 31, 2024
14.05Actions to Implement Management that is Conscious of Cost of Capital and Stock Price
Industrial Goods and Services »
20.05Eastern North Pacific Tropical Weather Outlook
20.05Atlantic Tropical Weather Outlook
20.05Water investors have withdrawn billions, says research
19.05Atlantic Tropical Weather Outlook
19.05Eastern North Pacific Tropical Weather Outlook
19.05IT Cosmetics and Kenvue Launch New Products
19.05Virgin Trains targets West Coast in return to rail
19.05Cashing In On The Stache
More »